TY - JOUR
T1 - Effects of the Ba3(VO4)2 additions on microwave dielectric properties of (Zr0.8Sn0.2)TiO4 ceramics
AU - Zhang, Zhiyuan
AU - Zhu, Haikui
AU - Zhang, Yan
AU - Chen, Yuhang
AU - Fu, Zhenxiao
AU - Huang, Kun
AU - Zhang, Qitu
N1 - Publisher Copyright:
© 2016, Springer Science+Business Media New York.
PY - 2017/1/1
Y1 - 2017/1/1
N2 - The effects of the Ba3(VO4)2 (BV) additions on the phase composition, microstructures, sintering characteristics and microwave dielectric properties of (Zr0.8Sn0.2)TiO4 (ZST) ceramics are investigated by an X-ray diffractometer, a scanning electron microscope and a network analyzer. The ZST and BV ceramics are all prepared by conventional solid-state method. BV can not only lower the sintering temperatures from 1650 to 1275 °C, but also speed up the grain growth of the ZST ceramics. But excessive additives deteriorate the microstructures and comprehensive properties of samples. As a result, ZST ceramics with 0.5 wt% BV can be well sintered at 1275 °C for 5 h and exhibit excellent microwave dielectric properties of εr = 36.6, Q × f = 46,000 GHz and τf = 1.47 ppm/°C.
AB - The effects of the Ba3(VO4)2 (BV) additions on the phase composition, microstructures, sintering characteristics and microwave dielectric properties of (Zr0.8Sn0.2)TiO4 (ZST) ceramics are investigated by an X-ray diffractometer, a scanning electron microscope and a network analyzer. The ZST and BV ceramics are all prepared by conventional solid-state method. BV can not only lower the sintering temperatures from 1650 to 1275 °C, but also speed up the grain growth of the ZST ceramics. But excessive additives deteriorate the microstructures and comprehensive properties of samples. As a result, ZST ceramics with 0.5 wt% BV can be well sintered at 1275 °C for 5 h and exhibit excellent microwave dielectric properties of εr = 36.6, Q × f = 46,000 GHz and τf = 1.47 ppm/°C.
UR - http://www.scopus.com/inward/record.url?scp=84991109269&partnerID=8YFLogxK
U2 - 10.1007/s10854-016-5765-x
DO - 10.1007/s10854-016-5765-x
M3 - 文章
AN - SCOPUS:84991109269
SN - 0957-4522
VL - 28
SP - 2044
EP - 2048
JO - Journal of Materials Science: Materials in Electronics
JF - Journal of Materials Science: Materials in Electronics
IS - 2
ER -