Abstract
The characteristics and testing principle of scanning electron microscope(SEM) and its application in the study of precipitated silica were introduced. Compared with transmission electron microscope, SEM could provide more accurate microstructure of the precipitated silica with moderate price, easy operation and simple result analysis. With SEM, the microstructure information of the precipitated silica, such as the particle size, aggregate shape and pore structure, could be obtained. SEM could be used to observe the modification effect in the study of precipitated silica modification. SEM could also be applied to characterize the dispersion of the precipitated silica in the study of precipitated silica/rubber composites.
| Translated title of the contribution | Application Status and Development of SEM in Study of Precipitated Silica |
|---|---|
| Original language | Chinese (Traditional) |
| Pages (from-to) | 216-222 |
| Number of pages | 7 |
| Journal | China Rubber Industry |
| Volume | 68 |
| Issue number | 3 |
| DOIs | |
| State | Published - 2021 |