Complex refractive index tunability of graphene at 1550 nm wavelength

F. Xu; S. Das; Y. Gong; Q. Liu; H. C. Chien; H. Y. Chiu; J. Wu; R. Hui

doi:10.1063/1.4906349

Complex refractive index tunability of graphene at 1550 nm wavelength

F. Xu, S. Das, Y. Gong, Q. Liu, H. C. Chien, H. Y. Chiu, J. Wu, R. Hui

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56 Scopus citations

Abstract

The complex refractive index of graphene fabricated using chemical vapor deposition is characterized at 1550 nm wavelength through the reflectivity measurement on a SiO₂/Si substrate. The observed tunability of the complex reflective index as the function of gate electric voltage is in agreement with the prediction based on the Kubo formula.

Original language	English
Article number	031109
Journal	Applied Physics Letters
Volume	106
Issue number	3
DOIs	https://doi.org/10.1063/1.4906349
State	Published - 19 Jan 2015
Externally published	Yes

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@article{7e2bedfa8ba4450fa9699d11fba96932,

title = "Complex refractive index tunability of graphene at 1550 nm wavelength",

abstract = "The complex refractive index of graphene fabricated using chemical vapor deposition is characterized at 1550 nm wavelength through the reflectivity measurement on a SiO2/Si substrate. The observed tunability of the complex reflective index as the function of gate electric voltage is in agreement with the prediction based on the Kubo formula.",

author = "F. Xu and S. Das and Y. Gong and Q. Liu and Chien, {H. C.} and Chiu, {H. Y.} and J. Wu and R. Hui",

note = "Publisher Copyright: {\textcopyright} 2015 AIP Publishing LLC.",

year = "2015",

month = jan,

day = "19",

doi = "10.1063/1.4906349",

language = "英语",

volume = "106",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "3",

}

TY - JOUR

T1 - Complex refractive index tunability of graphene at 1550 nm wavelength

AU - Xu, F.

AU - Das, S.

AU - Gong, Y.

AU - Liu, Q.

AU - Chien, H. C.

AU - Chiu, H. Y.

AU - Wu, J.

AU - Hui, R.

PY - 2015/1/19

Y1 - 2015/1/19

N2 - The complex refractive index of graphene fabricated using chemical vapor deposition is characterized at 1550 nm wavelength through the reflectivity measurement on a SiO2/Si substrate. The observed tunability of the complex reflective index as the function of gate electric voltage is in agreement with the prediction based on the Kubo formula.

AB - The complex refractive index of graphene fabricated using chemical vapor deposition is characterized at 1550 nm wavelength through the reflectivity measurement on a SiO2/Si substrate. The observed tunability of the complex reflective index as the function of gate electric voltage is in agreement with the prediction based on the Kubo formula.

UR - http://www.scopus.com/inward/record.url?scp=84923814414&partnerID=8YFLogxK

U2 - 10.1063/1.4906349

DO - 10.1063/1.4906349

M3 - 文章

AN - SCOPUS:84923814414

SN - 0003-6951

VL - 106

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 3

M1 - 031109

ER -

Complex refractive index tunability of graphene at 1550 nm wavelength

Abstract

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