Implementing and Quantifying the Shape-Memory Effect of Single Polymeric Micro/Nanowires with an Atomic Force Microscope

Liang Fang, Oliver E.C. Gould, Liudmila Lysyakova, Yi Jiang, Tilman Sauter, Oliver Frank, Tino Becker, Michael Schossig, Karl Kratz, Andreas Lendlein

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

The implementation of shape-memory effects (SME) in polymeric micro- or nano-objects currently relies on the application of indirect macroscopic manipulation techniques, for example, stretchable molds or phantoms, to ensembles of small objects. Here, we introduce a method capable of the controlled manipulation and SME quantification of individual micro- and nano-objects in analogy to macroscopic thermomechanical test procedures. An atomic force microscope was utilized to address individual electro-spun poly(ether urethane) (PEU) micro- or nanowires freely suspended between two micropillars on a micro-structured silicon substrate. In this way, programming strains of 10±1% or 21±1% were realized, which could be successfully fixed. An almost complete restoration of the original free-suspended shape during heating confirmed the excellent shape-memory performance of the PEU wires. Apparent recovery stresses of σmax,app=1.2±0.1 and 33.3±0.1 MPa were obtained for a single microwire and nanowire, respectively. The universal AFM test platform described here enables the implementation and quantification of a thermomechanically induced function for individual polymeric micro- and nanosystems.

Original languageEnglish
Pages (from-to)2078-2084
Number of pages7
JournalChemPhysChem
Volume19
Issue number16
DOIs
StatePublished - 17 Aug 2018

Keywords

  • atomic force microscopy
  • cyclic thermomechanical testing
  • materials science
  • shape-memory effect
  • soft matter micro- and nanowires

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