TY - JOUR
T1 - Low loss (Ba1−xSrx)(Co1/3Nb2/3)O3 solid solution
T2 - phase evolution, microstructure and microwave dielectric properties
AU - Wang, Zhefei
AU - Huang, Baoyu
AU - Wang, Lixi
AU - Fu, Zhenxiao
AU - Zhang, Qitu
N1 - Publisher Copyright:
© 2015, Springer Science+Business Media New York.
PY - 2015/6/1
Y1 - 2015/6/1
N2 - (Ba1−xSrx)(Co1/3Nb2/3)O3 (0 ≤ x ≤ 0.5) microwave dielectric ceramics had been prepared using the solid-state reaction method. The dense microstructures with small grains were obtained. All Sr2+ substituted samples exhibited the perovskite phase. The structure transition from cubic to hexagonal occurred with the increase of x, which led to higher degree of 1:2 ordered structure in the B site. The improved Q × f value was correlated monotonously with the ordering parameters S. The dielectric constant (εr) and the temperature coefficient of resonant frequency (τf) could be effectively tuned by tailoring x. A good combination of microwave dielectric properties was obtained for (Ba0.95Sr0.05)(Co1/3Nb2/3)O3 sintered at 1380 °C: εr = 33.3, Q × f = 87,120 GHz, τf = 4 ppm/°C.
AB - (Ba1−xSrx)(Co1/3Nb2/3)O3 (0 ≤ x ≤ 0.5) microwave dielectric ceramics had been prepared using the solid-state reaction method. The dense microstructures with small grains were obtained. All Sr2+ substituted samples exhibited the perovskite phase. The structure transition from cubic to hexagonal occurred with the increase of x, which led to higher degree of 1:2 ordered structure in the B site. The improved Q × f value was correlated monotonously with the ordering parameters S. The dielectric constant (εr) and the temperature coefficient of resonant frequency (τf) could be effectively tuned by tailoring x. A good combination of microwave dielectric properties was obtained for (Ba0.95Sr0.05)(Co1/3Nb2/3)O3 sintered at 1380 °C: εr = 33.3, Q × f = 87,120 GHz, τf = 4 ppm/°C.
UR - http://www.scopus.com/inward/record.url?scp=84939984676&partnerID=8YFLogxK
U2 - 10.1007/s10854-015-2978-3
DO - 10.1007/s10854-015-2978-3
M3 - 文章
AN - SCOPUS:84939984676
SN - 0957-4522
VL - 26
SP - 4273
EP - 4279
JO - Journal of Materials Science: Materials in Electronics
JF - Journal of Materials Science: Materials in Electronics
IS - 6
ER -