Metal-induced photoluminescence quenching of tri-(8-hydroxyquinoline) aluminum

Y. Wu; Y. C. Zhou; H. R. Wu; Y. Q. Zhan; J. Zhou; S. T. Zhang; J. M. Zhao; Z. J. Wang; X. M. Ding; X. Y. Hou

doi:10.1063/1.1991985

Metal-induced photoluminescence quenching of tri-(8-hydroxyquinoline) aluminum

Y. Wu, Y. C. Zhou, H. R. Wu, Y. Q. Zhan, J. Zhou, S. T. Zhang, J. M. Zhao, Z. J. Wang, X. M. Ding, X. Y. Hou

Fudan University

Research output: Contribution to journal › Article › peer-review

39 Scopus citations

Abstract

Metal-induced photoluminescence (PL) quenching of organic thin film [tri-(8-hydroxyquinoline) aluminum (Alq)] has been investigated both experimentally and theoretically. By doing experiments in situ in high vacuum, we have measured the PL intensity of Alq film deposited on metal-doped Alq film or metal film as a function of its thickness. For the case of metal-doped Alq film, exciton diffusion length of Alq is derived as LD =8.6±0.1 nm by analyzing experimental results and using a model based on diffusion and interface dissociation of excitons. For the case of metal film, another model considering exciton diffusion, interface dissociation, and nonradiative energy transfer to the metal is suggested to explain the experimental observation. Good agreement is achieved between theory and experiment.

Original language	English
Article number	044104
Journal	Applied Physics Letters
Volume	87
Issue number	4
DOIs	https://doi.org/10.1063/1.1991985
State	Published - 25 Jul 2005
Externally published	Yes

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title = "Metal-induced photoluminescence quenching of tri-(8-hydroxyquinoline) aluminum",

abstract = "Metal-induced photoluminescence (PL) quenching of organic thin film [tri-(8-hydroxyquinoline) aluminum (Alq)] has been investigated both experimentally and theoretically. By doing experiments in situ in high vacuum, we have measured the PL intensity of Alq film deposited on metal-doped Alq film or metal film as a function of its thickness. For the case of metal-doped Alq film, exciton diffusion length of Alq is derived as LD =8.6±0.1 nm by analyzing experimental results and using a model based on diffusion and interface dissociation of excitons. For the case of metal film, another model considering exciton diffusion, interface dissociation, and nonradiative energy transfer to the metal is suggested to explain the experimental observation. Good agreement is achieved between theory and experiment.",

author = "Y. Wu and Zhou, {Y. C.} and Wu, {H. R.} and Zhan, {Y. Q.} and J. Zhou and Zhang, {S. T.} and Zhao, {J. M.} and Wang, {Z. J.} and Ding, {X. M.} and Hou, {X. Y.}",

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doi = "10.1063/1.1991985",

language = "英语",

volume = "87",

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T1 - Metal-induced photoluminescence quenching of tri-(8-hydroxyquinoline) aluminum

AU - Wu, Y.

AU - Zhou, Y. C.

AU - Wu, H. R.

AU - Zhan, Y. Q.

AU - Zhou, J.

AU - Zhang, S. T.

AU - Zhao, J. M.

AU - Wang, Z. J.

AU - Ding, X. M.

AU - Hou, X. Y.

PY - 2005/7/25

Y1 - 2005/7/25

N2 - Metal-induced photoluminescence (PL) quenching of organic thin film [tri-(8-hydroxyquinoline) aluminum (Alq)] has been investigated both experimentally and theoretically. By doing experiments in situ in high vacuum, we have measured the PL intensity of Alq film deposited on metal-doped Alq film or metal film as a function of its thickness. For the case of metal-doped Alq film, exciton diffusion length of Alq is derived as LD =8.6±0.1 nm by analyzing experimental results and using a model based on diffusion and interface dissociation of excitons. For the case of metal film, another model considering exciton diffusion, interface dissociation, and nonradiative energy transfer to the metal is suggested to explain the experimental observation. Good agreement is achieved between theory and experiment.

AB - Metal-induced photoluminescence (PL) quenching of organic thin film [tri-(8-hydroxyquinoline) aluminum (Alq)] has been investigated both experimentally and theoretically. By doing experiments in situ in high vacuum, we have measured the PL intensity of Alq film deposited on metal-doped Alq film or metal film as a function of its thickness. For the case of metal-doped Alq film, exciton diffusion length of Alq is derived as LD =8.6±0.1 nm by analyzing experimental results and using a model based on diffusion and interface dissociation of excitons. For the case of metal film, another model considering exciton diffusion, interface dissociation, and nonradiative energy transfer to the metal is suggested to explain the experimental observation. Good agreement is achieved between theory and experiment.

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DO - 10.1063/1.1991985

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VL - 87

JO - Applied Physics Letters

JF - Applied Physics Letters

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ER -

Metal-induced photoluminescence quenching of tri-(8-hydroxyquinoline) aluminum

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