Preparation of smooth potassium hexatitanate nanofilms by sol-gel method

Q. H. Qian; X. F. Zhou; Y. Y. Hu; Ch Liu; X. Feng; X. H. Lu

doi:10.1007/s10853-007-1695-6

Preparation of smooth potassium hexatitanate nanofilms by sol-gel method

Q. H. Qian, X. F. Zhou, Y. Y. Hu, Ch Liu, X. Feng, X. H. Lu

College of Chemical Engineering

Nanjing Tech University

Research output: Contribution to journal › Article › peer-review

16 Scopus citations

Abstract

New nanosmooth potassium hexatitanate films have been prepared on crystalline Si (111) and ITO glass substrates by sol-gel method using Ti(n-OC₄H₉)₄ and CH₃COOK as precursors. Atomic force microscopy (AFM) topographic images were analyzed to select the optimal preparation conditions for the films. It is shown that the films consist of flat particles with the ratio of diameter to height around 11. The root mean square (RMS) roughness of the films based on the measurement of an area of 2,000 nm × 2,000 nm in AFM images is 6.4 nm. The crystal growth process of potassium hexatitanate film was characterized by XRD, Raman spectra, and TEM. The results showed that the crystal growth of potassium hexatitanate nanofilm is a confined growth mechanism. Electrochemical measurements demonstrated that the photocurrent of potassium hexatitanate film electrode is more stable than that of TiO₂ film electrode.

Original language	English
Pages (from-to)	8222-8229
Number of pages	8
Journal	Journal of Materials Science
Volume	42
Issue number	19
DOIs	https://doi.org/10.1007/s10853-007-1695-6
State	Published - Oct 2007

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title = "Preparation of smooth potassium hexatitanate nanofilms by sol-gel method",

abstract = "New nanosmooth potassium hexatitanate films have been prepared on crystalline Si (111) and ITO glass substrates by sol-gel method using Ti(n-OC4H9)4 and CH3COOK as precursors. Atomic force microscopy (AFM) topographic images were analyzed to select the optimal preparation conditions for the films. It is shown that the films consist of flat particles with the ratio of diameter to height around 11. The root mean square (RMS) roughness of the films based on the measurement of an area of 2,000 nm × 2,000 nm in AFM images is 6.4 nm. The crystal growth process of potassium hexatitanate film was characterized by XRD, Raman spectra, and TEM. The results showed that the crystal growth of potassium hexatitanate nanofilm is a confined growth mechanism. Electrochemical measurements demonstrated that the photocurrent of potassium hexatitanate film electrode is more stable than that of TiO2 film electrode.",

author = "Qian, {Q. H.} and Zhou, {X. F.} and Hu, {Y. Y.} and Ch Liu and X. Feng and Lu, {X. H.}",

year = "2007",

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doi = "10.1007/s10853-007-1695-6",

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T1 - Preparation of smooth potassium hexatitanate nanofilms by sol-gel method

AU - Qian, Q. H.

AU - Zhou, X. F.

AU - Hu, Y. Y.

AU - Liu, Ch

AU - Feng, X.

AU - Lu, X. H.

PY - 2007/10

Y1 - 2007/10

N2 - New nanosmooth potassium hexatitanate films have been prepared on crystalline Si (111) and ITO glass substrates by sol-gel method using Ti(n-OC4H9)4 and CH3COOK as precursors. Atomic force microscopy (AFM) topographic images were analyzed to select the optimal preparation conditions for the films. It is shown that the films consist of flat particles with the ratio of diameter to height around 11. The root mean square (RMS) roughness of the films based on the measurement of an area of 2,000 nm × 2,000 nm in AFM images is 6.4 nm. The crystal growth process of potassium hexatitanate film was characterized by XRD, Raman spectra, and TEM. The results showed that the crystal growth of potassium hexatitanate nanofilm is a confined growth mechanism. Electrochemical measurements demonstrated that the photocurrent of potassium hexatitanate film electrode is more stable than that of TiO2 film electrode.

AB - New nanosmooth potassium hexatitanate films have been prepared on crystalline Si (111) and ITO glass substrates by sol-gel method using Ti(n-OC4H9)4 and CH3COOK as precursors. Atomic force microscopy (AFM) topographic images were analyzed to select the optimal preparation conditions for the films. It is shown that the films consist of flat particles with the ratio of diameter to height around 11. The root mean square (RMS) roughness of the films based on the measurement of an area of 2,000 nm × 2,000 nm in AFM images is 6.4 nm. The crystal growth process of potassium hexatitanate film was characterized by XRD, Raman spectra, and TEM. The results showed that the crystal growth of potassium hexatitanate nanofilm is a confined growth mechanism. Electrochemical measurements demonstrated that the photocurrent of potassium hexatitanate film electrode is more stable than that of TiO2 film electrode.

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Preparation of smooth potassium hexatitanate nanofilms by sol-gel method

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