TY - JOUR
T1 - Revisiting point defects in cubic boron arsenide from first-principles calculations
AU - Wang, Jingyi
AU - Li, Qi
AU - Zhang, Zhineng
AU - Zhao, Puqin
AU - Liu, Juqing
AU - Cheng, Yingchun
N1 - Publisher Copyright:
© 2025 Elsevier B.V.
PY - 2025/8/15
Y1 - 2025/8/15
N2 - Cubic boron arsenide (c-BAs), known for its high carrier mobilities and exceptional thermal conductivity at room temperature, was successfully synthesized via chemical vapor transport. Using first-principles calculations, we revisit the electronic and thermodynamic properties of point defects in c-BAs. Acceptor defects such as VB, BAs, and SiAs, as well as donor defects like AsB and SiB are expected to dominate under both arsenic-rich and boron-rich conditions. Furthermore, acceptor defects exhibit lower formation energies than donor defects, indicating that c-BAs behaves as a p-type semiconductor, consistent with experimental observations. The VB defect is predicted to be dynamically stable due to its high migration barrier. Additionally, the density of states of AsB reveals the presence of in-gap defect states, which could lead to the formation of multiple recombination centers. This work provides valuable insights into the defect physics of c-BAs and will support the development of device applications based on this material.
AB - Cubic boron arsenide (c-BAs), known for its high carrier mobilities and exceptional thermal conductivity at room temperature, was successfully synthesized via chemical vapor transport. Using first-principles calculations, we revisit the electronic and thermodynamic properties of point defects in c-BAs. Acceptor defects such as VB, BAs, and SiAs, as well as donor defects like AsB and SiB are expected to dominate under both arsenic-rich and boron-rich conditions. Furthermore, acceptor defects exhibit lower formation energies than donor defects, indicating that c-BAs behaves as a p-type semiconductor, consistent with experimental observations. The VB defect is predicted to be dynamically stable due to its high migration barrier. Additionally, the density of states of AsB reveals the presence of in-gap defect states, which could lead to the formation of multiple recombination centers. This work provides valuable insights into the defect physics of c-BAs and will support the development of device applications based on this material.
KW - c-BAs
KW - Extrinsic defect
KW - First-principles calculations
KW - Intrinsic defect
UR - http://www.scopus.com/inward/record.url?scp=105003303210&partnerID=8YFLogxK
U2 - 10.1016/j.physb.2025.417293
DO - 10.1016/j.physb.2025.417293
M3 - 文章
AN - SCOPUS:105003303210
SN - 0921-4526
VL - 711
JO - Physica B: Condensed Matter
JF - Physica B: Condensed Matter
M1 - 417293
ER -