TY - GEN
T1 - A simple measuring method of reflectivity for radar absorbing material
AU - Feng, Yongbao
AU - Qiu, Tai
AU - Shen, Chunying
AU - Li, Xiaoyun
PY - 2005
Y1 - 2005
N2 - The basic principle of measuring reflectivity for radar absorbing material (RAM) is analyzed. And a simple method for measuring reflectivity of radar absorbing material using vector network analyzer HP8722ET and APC-7mm coaxial line is presented. The results indicate that the reflectivity of the radar absorbing material can be measured in 0.05-18GHz using this method. Under the ordinary laboratory condition, the reflectivity of the RAM can be measured accurately without microwave darkroom and other strict terms. Measurement results of reflectivity for single-layer RAM indicate that the measured reflectivity accords with the theoretical calculation of the reflectivity. The measured reflectivity using coaxial method is consistent with the reflectivity using arch method. Some errors exit between the measured results using arch method and theoretical calculation results because the sample's size is large and the thickness of the two-layer RAM can hardly be prepared homogeneously. The coaxial sample under test is small and the thickness can be controlled accurately, so the measured reflectivity is consistent with the theoretical calculation of the reflectivity.
AB - The basic principle of measuring reflectivity for radar absorbing material (RAM) is analyzed. And a simple method for measuring reflectivity of radar absorbing material using vector network analyzer HP8722ET and APC-7mm coaxial line is presented. The results indicate that the reflectivity of the radar absorbing material can be measured in 0.05-18GHz using this method. Under the ordinary laboratory condition, the reflectivity of the RAM can be measured accurately without microwave darkroom and other strict terms. Measurement results of reflectivity for single-layer RAM indicate that the measured reflectivity accords with the theoretical calculation of the reflectivity. The measured reflectivity using coaxial method is consistent with the reflectivity using arch method. Some errors exit between the measured results using arch method and theoretical calculation results because the sample's size is large and the thickness of the two-layer RAM can hardly be prepared homogeneously. The coaxial sample under test is small and the thickness can be controlled accurately, so the measured reflectivity is consistent with the theoretical calculation of the reflectivity.
UR - http://www.scopus.com/inward/record.url?scp=33847175894&partnerID=8YFLogxK
U2 - 10.1109/APMC.2005.1606545
DO - 10.1109/APMC.2005.1606545
M3 - 会议稿件
AN - SCOPUS:33847175894
SN - 078039433X
SN - 9780780394339
T3 - Asia-Pacific Microwave Conference Proceedings, APMC
SP - 3
EP - 5
BT - APMC 2005
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - APMC 2005: Asia-Pacific Microwave Conference 2005
Y2 - 4 December 2005 through 7 December 2005
ER -