摘要
Single- and multilayer MoS 2 films are deposited onto Si/SiO 2 using the mechanical exfoliation technique. The films were then used for the fabrication of field-effect transistors (FETs). These FET devices can be used as gas sensors to detect nitrous oxide (NO). Although the single-layer MoS 2 device shows a rapid response after exposure to NO, the current was found to be unstable. The two-, three-, and four-layer MoS 2 devices show both stable and sensitive responses to NO down to a concentration of 0.8 ppm.
源语言 | 英语 |
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页(从-至) | 63-67 |
页数 | 5 |
期刊 | Small |
卷 | 8 |
期 | 1 |
DOI | |
出版状态 | 已出版 - 9 1月 2012 |
已对外发布 | 是 |