In situ high-temperature X-ray diffraction studies of mixed-conducting perovskite-type oxides

The high-temperature x-ray diffraction studies of mixed-conducting perovskite-type oxides were discussed. The three types of typical mixed-conducting perovskites were synthesized by solid-state reaction. The properties of perovskite such as lattice parameter, thermal expansion coefficient and phase stability were characterized by in situ high temperature x-ray diffraction. The results indicated high thermal expansion coefficients for perovskites and the lattice parameters were observed to be increasing linearly with temperature.