Z-contrast atom counting using the few-layer graphene sheets

F. Q. Song, Y. Y. Qin, W. F. Ding, K. M. Liao, Z. G. Li, Z. W. Wang, J. F. Zhou, J. G. Wan, Z. Y. Li, G. H. Wang

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Upon the development of the quantitative scanning transmission electron microscopy (Q-STEM), individually counting the gold atom has been achieved. The correlation of the signals to the atom quantity (N), i.e. calibration, is its crucial work One has to seek the ultra-fine mass standards, where the size-selected gold clusters rank the best recently [1]. However, practically this is difficult for light elements, since STEM intensity is proportional to Zα, where Z is atomic number of the elements and a is in the range of 1.5-1.9 depending on the detector collection angle, sample thickness, and the Debye-Waller factor of the atomic species. As a result, the light elements would have a much weaker image contrast than that of heavy elements. This could be even more difficult for the carbon particles supported by the Formvar films. Graphene layers are featured by large scale uniformity and discrete layer steps, which shed light on precision calibration of the carbon atomic scales.

源语言英语
主期刊名Proceedings - 2010 8th International Vacuum Electron Sources Conference and Nanocarbon, IVESC 2010 and NANOcarbon 2010
406-407
页数2
DOI
出版状态已出版 - 2010
已对外发布
活动8th International Vacuum Electron Sources Conference, IVESC 2010 and NANOcarbon 2010 - Nanjing, 中国
期限: 14 10月 201016 10月 2010

出版系列

姓名Proceedings - 2010 8th International Vacuum Electron Sources Conference and Nanocarbon, IVESC 2010 and NANOcarbon 2010

会议

会议8th International Vacuum Electron Sources Conference, IVESC 2010 and NANOcarbon 2010
国家/地区中国
Nanjing
时期14/10/1016/10/10

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