Highly Reliable Van Der Waals Memory Boosted by a Single 2D Charge Trap Medium

Chao Liu, Jie Pan, Qihui Yuan, Chao Zhu, Jianquan Liu, Feixiang Ge, Jijie Zhu, Haitao Xie, Dawei Zhou, Zicheng Zhang, Peiyi Zhao, Bobo Tian, Wei Huang, Lin Wang

Research output: Contribution to journal › Article › peer-review

18 Scopus citations

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