Abstract
A simple approach is developed to identify the layer number of 2D MoS 2 sheets. By using an optical imaging method combined with image analysis software, a high-contrast image of the MoS 2 sheets can be extracted from the red (R) channel of the color optical microscopy image. The value of the intensity difference in the grayscale image of the R channel between MoS 2 sheets (1-3 layers) and the SiO 2 substrate can be used to identify the layer number of the sheet.
Original language | English |
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Pages (from-to) | 682-686 |
Number of pages | 5 |
Journal | Small |
Volume | 8 |
Issue number | 5 |
DOIs | |
State | Published - 12 Mar 2012 |
Externally published | Yes |
Keywords
- Raman spectroscopy
- atomic force microscopy
- chalcogenides
- layered materials
- optical imaging