Short-circuiting in fullerene devices studied by in situ electrical measurement in high vacuum and infrared imaging analysis

H. R. Wu, M. L. Wang, Q. L. Song, Y. Wu, Z. T. Xie, X. D. Gao, X. M. Ding, X. Y. Hou

Research output: Contribution to journal › Article › peer-review

Fingerprint

Dive into the research topics of 'Short-circuiting in fullerene devices studied by in situ electrical measurement in high vacuum and infrared imaging analysis'. Together they form a unique fingerprint.

Material Science