Applications of atomic force microscopy in characterizing nanomaterials

Pei Wei, Hai Li

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

Original language	English
Title of host publication	Characterization Methods for Nanostructures
Publisher	World Scientific Publishing Co. Pte Ltd
Pages	175-216
Number of pages	42
Volume	4-4
ISBN (Electronic)	9789813277878
ISBN (Print)	9789813277786
State	Published - 13 Aug 2019

Cite this

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title = "Applications of atomic force microscopy in characterizing nanomaterials",

author = "Pei Wei and Hai Li",

year = "2019",

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pages = "175--216",

booktitle = "Characterization Methods for Nanostructures",

publisher = "World Scientific Publishing Co. Pte Ltd",

address = "新加坡",

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T1 - Applications of atomic force microscopy in characterizing nanomaterials

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AU - Li, Hai

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BT - Characterization Methods for Nanostructures

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