Applications of atomic force microscopy in characterizing nanomaterials

Pei Wei, Hai Li

科研成果: 书/报告/会议事项章节 › 章节 › 同行评审

源语言	英语
主期刊名	Characterization Methods for Nanostructures
出版商	World Scientific Publishing Co. Pte Ltd
页	175-216
页数	42
卷	4-4
ISBN（电子版）	9789813277878
ISBN（印刷版）	9789813277786
出版状态	已出版 - 13 8月 2019

其它文件与链接

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