Applications of Atomic Force Microscopy in Characterizing Nanomaterials

Pei Wei, Hai Li

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

Original language	English
Title of host publication	World Scientific Series in Nanoscience and Nanotechnology
Publisher	World Scientific
Pages	175-216
Number of pages	42
Edition	4
DOIs	https://doi.org/10.1142/9789813277861_0003
State	Published - 2020

Name	World Scientific Series in Nanoscience and Nanotechnology
Number	4
Volume	18
ISSN (Print)	2301-301X
ISSN (Electronic)	2335-6693

Access to Document

@inbook{702abd3b85764940b0c69d8a0fcb3e8f,

title = "Applications of Atomic Force Microscopy in Characterizing Nanomaterials",

author = "Pei Wei and Hai Li",

year = "2020",

doi = "10.1142/9789813277861_0003",

language = "英语",

series = "World Scientific Series in Nanoscience and Nanotechnology",

publisher = "World Scientific",

number = "4",

pages = "175--216",

booktitle = "World Scientific Series in Nanoscience and Nanotechnology",

address = "新加坡",

edition = "4",

}

TY - CHAP

T1 - Applications of Atomic Force Microscopy in Characterizing Nanomaterials

AU - Wei, Pei

AU - Li, Hai

PY - 2020

Y1 - 2020

UR - http://www.scopus.com/inward/record.url?scp=85150501720&partnerID=8YFLogxK

U2 - 10.1142/9789813277861_0003

DO - 10.1142/9789813277861_0003

M3 - 章节

AN - SCOPUS:85150501720

T3 - World Scientific Series in Nanoscience and Nanotechnology

SP - 175

EP - 216

BT - World Scientific Series in Nanoscience and Nanotechnology

PB - World Scientific

ER -