Applications of Atomic Force Microscopy in Characterizing Nanomaterials

Pei Wei, Hai Li

科研成果: 书/报告/会议事项章节 › 章节 › 同行评审

源语言	英语
主期刊名	World Scientific Series in Nanoscience and Nanotechnology
出版商	World Scientific
页	175-216
页数	42
版本	4
DOI	https://doi.org/10.1142/9789813277861_0003
出版状态	已出版 - 2020

姓名	World Scientific Series in Nanoscience and Nanotechnology
编号	4
卷	18
ISSN（印刷版）	2301-301X
ISSN（电子版）	2335-6693

访问文件

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