Investigation of shear-banding mechanism in fully dense nanocrystalline Ni sheet

Rongtao Zhu; Jianqiu Zhou; Xinbo Li; Hua Jiang; Xiang Ling

doi:10.1016/j.matchar.2010.01.004

Investigation of shear-banding mechanism in fully dense nanocrystalline Ni sheet

Rongtao Zhu, Jianqiu Zhou, Xinbo Li, Hua Jiang, Xiang Ling

Nanjing Tech University

科研成果: 期刊稿件 › 文章 › 同行评审

10 引用（Scopus）

摘要

Evolution of shear banding in fully dense electrodeposited nanocrystalline Ni was successfully monitored by using a digital image correlation technique under a quasi-static uniaxial tensile load. To investigate the microscopic physical mechanism of the shear banding, in-situ tensile testing for the nanocrystalline Ni sample was conducted in a transmission electron microscope and fracture surface of the sample was examined by field emission scanning electron microscope. The results suggest that grain boundary migration based on atomic diffusion is a main carrier of the shear banding.

源语言	英语
页（从-至）	396-401
页数	6
期刊	Materials Characterization
卷	61
期	4
DOI	https://doi.org/10.1016/j.matchar.2010.01.004
出版状态	已出版 - 4月 2010

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10.1016/j.matchar.2010.01.004

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@article{38d05611019e414cace65582a0d4df19,

title = "Investigation of shear-banding mechanism in fully dense nanocrystalline Ni sheet",

abstract = "Evolution of shear banding in fully dense electrodeposited nanocrystalline Ni was successfully monitored by using a digital image correlation technique under a quasi-static uniaxial tensile load. To investigate the microscopic physical mechanism of the shear banding, in-situ tensile testing for the nanocrystalline Ni sample was conducted in a transmission electron microscope and fracture surface of the sample was examined by field emission scanning electron microscope. The results suggest that grain boundary migration based on atomic diffusion is a main carrier of the shear banding.",

keywords = "Digital image correlation, Fracture surface, In-situ TEM testing, Nanocrystalline Ni, Shear-banding mechanism",

author = "Rongtao Zhu and Jianqiu Zhou and Xinbo Li and Hua Jiang and Xiang Ling",

year = "2010",

month = apr,

doi = "10.1016/j.matchar.2010.01.004",

language = "英语",

volume = "61",

pages = "396--401",

journal = "Materials Characterization",

issn = "1044-5803",

publisher = "Elsevier Inc.",

number = "4",

}

TY - JOUR

T1 - Investigation of shear-banding mechanism in fully dense nanocrystalline Ni sheet

AU - Zhu, Rongtao

AU - Zhou, Jianqiu

AU - Li, Xinbo

AU - Jiang, Hua

AU - Ling, Xiang

PY - 2010/4

Y1 - 2010/4

N2 - Evolution of shear banding in fully dense electrodeposited nanocrystalline Ni was successfully monitored by using a digital image correlation technique under a quasi-static uniaxial tensile load. To investigate the microscopic physical mechanism of the shear banding, in-situ tensile testing for the nanocrystalline Ni sample was conducted in a transmission electron microscope and fracture surface of the sample was examined by field emission scanning electron microscope. The results suggest that grain boundary migration based on atomic diffusion is a main carrier of the shear banding.

AB - Evolution of shear banding in fully dense electrodeposited nanocrystalline Ni was successfully monitored by using a digital image correlation technique under a quasi-static uniaxial tensile load. To investigate the microscopic physical mechanism of the shear banding, in-situ tensile testing for the nanocrystalline Ni sample was conducted in a transmission electron microscope and fracture surface of the sample was examined by field emission scanning electron microscope. The results suggest that grain boundary migration based on atomic diffusion is a main carrier of the shear banding.

KW - Digital image correlation

KW - Fracture surface

KW - In-situ TEM testing

KW - Nanocrystalline Ni

KW - Shear-banding mechanism

UR - http://www.scopus.com/inward/record.url?scp=77949489742&partnerID=8YFLogxK

U2 - 10.1016/j.matchar.2010.01.004

DO - 10.1016/j.matchar.2010.01.004

M3 - 文章

AN - SCOPUS:77949489742

SN - 1044-5803

VL - 61

SP - 396

EP - 401

JO - Materials Characterization

JF - Materials Characterization

IS - 4

ER -

Investigation of shear-banding mechanism in fully dense nanocrystalline Ni sheet

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